The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is supplied in five different sizes. The map shown is the 1X version. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are1 2, 1/4 and 1/8 respectively.
The upper and lower rows in each test pattern array, contain the gray scales and the numbers in the boxes indicate their approximate reflection density. The four corner areas are 0.7 density, all within 0.02 density, which are useful for checking uniformity of illumination. The inner rows contain the sinusoidal areas, having the indicated spatial frequencies noted on the map. Nominal modulation of the sinusoidal areas is 60%.
Each pattern array is supplied with a digital microdensitometer scan that lists the individual modulation values and density values of the gray scales. Modulation values are also given with compensation for the MTF of the microdensitometer.
The SINE M-13-60-1X pattern array is available in kit form with a 1.0 c/mm Ronchi Ruling standard as specified by the Federal Bureau of Investigation (FBI) specification for performance testing of fingerprint scanners. Software is available for use of this pattern to evaluate scanners. There is no charge for this software. (See also the FBI SIQT Scanner Test Chart).
The Sinusoidal Array SINE M-14 was designed for various electro-optical applications, particularl...
Material: Reflective Material &nb...