Image Analysis Micro Line / Dot Standard (IAM-6)


SKU: IAM-6 Category:


A standard specifically designed to calibrate CCD, CMOS devices and other geometric measuring imaging systems where critical measurement is important. Electronic sensors often have spurious resolution created by pixel dithering. The IAM-6 limits this calibration problem by providing known dot and line sizes to test the sensor / optical capabilities.

If the IAM-6 is purchased with NIST Traceable Certification, APPLIED IMAGE recommends recertification of your stage micrometer at least every 2 years.

Additional information

Billable Weight: 2 lbs
Accredited Calibration

Yes, No


Chrome on GLASS, Chrome on OPAL

Overall Size

1.0 in. x 3.0 in.  –  25.4mm x 76.2mm