Image Analysis Stage Mapping / Grid Pattern (IAM-5)
$310.00 – $950.00
Description
The ideal standard for verifying / quantifying multiple image analysis parameters. Optical (barrel) distortion, alignment between systems, or optical paths. Cell areas for particle counting.
If the IAM-5 is purchased with NIST Traceable Certification, APPLIED IMAGE recommends recertification of your stage micrometer at least every 2 years.
Additional information
Billable Weight: | 2 lbs |
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Accredited Calibration | Yes, No |
Material | Chrome on GLASS, Chrome on OPAL |
Pitch | 10μm, 200μm, 1000μm |
Polarity | Positive Image |
Overall Size | 1.0 in. x 3.0 in. – 25.4mm x 76.2mm |
Active Image Area | 20mm x 50mm |