Image Analysis Stage Mapping / Grid Pattern (IAM-5)
$280.00 – $860.00
The ideal standard for verifying / quantifying multiple image analysis parameters. Optical (barrel) distortion, alignment between systems, or optical paths. Cell areas for particle counting.
If the IAM-5 is purchased with NIST Traceable Certification, APPLIED IMAGE recommends recertification of your stage micrometer at least every 2 years.
|Billable Weight:||2 lbs|
Chrome on GLASS, Chrome on OPAL
10μm, 200μm, 1000μm
1.0 in. x 3.0 in. – 25.4mm x 76.2mm
|Active Image Area||
20mm x 50mm