Image Analysis Stage Mapping / Grid Pattern (IAM-5)


SKU: IAM-5 Category:


The ideal standard for verifying / quantifying multiple image analysis parameters. Optical (barrel) distortion, alignment between systems, or optical paths. Cell areas for particle counting.

If the IAM-5 is purchased with NIST Traceable Certification, APPLIED IMAGE recommends recertification of your stage micrometer at least every 2 years.

Additional information

Billable Weight: 2 lbs
Accredited Calibration

Yes, No


Chrome on GLASS, Chrome on OPAL


10μm, 200μm, 1000μm


Positive Image

Overall Size

1.0 in. x 3.0 in. – 25.4mm x 76.2mm

Active Image Area

20mm x 50mm