by Sean Pratt | Aug 13, 2018 | blog
When customers come to us to design & manufacture a custom component, the conversation usually begins with the substrate. There is a lot to consider beyond just glass, paper, or film. Imaging on each has its advantages, are there are plenty of variations within...
by Sean Pratt | Jul 17, 2018 | blog
Using USAF-1951 Resolution Test Target Resolution features of the USAF-1951 Resolution Chart are arranged in elements and groups. Each Element is made up of equally spaced bars; three horizontal and three vertical. Groups consist of six elements labeled 1 through 6....
by Sean Pratt | Jul 17, 2018 | blog
Using NBS-1010A Resolution Test Target A resolution test chart is used to allow quick and easy testing of the ability of an optical system to produce images with fine detail. The patterns are in groups which progressively get smaller. The smallest group for which the...
by Sean Pratt | Aug 24, 2017 | blog
Dropped and broke your stage micrometer? Scratched while cleaning or mishandling it? This can be easily avoided. Remember. Most stage micrometer’s substrate material consists of a fragile thin piece of glass or opal material and the scale image is manufactured...
by Sean Pratt | Aug 24, 2017 | blog
Today there are a myriad of off-the-shelf test targets and charts on various substrate materials and in a wide range of sizes from a multitude of companies for general or specific applications. To help narrow your chose of the best target/chart for your application it...
by Sean Pratt | Aug 24, 2017 | blog
One of the common misconceptions in using a reticle scale in an optical system is that the reticle scale (or pattern) noted dimensions will be the dimensions of the sample being measured within the optical instrument. This is a major misconception and is not true....