by Sean Pratt | Dec 28, 2016 | Uncategorized
Recently we had a customer return an Applied Image part, a stage micrometer (SM-2), for recalibration to maintain traceability. What was fascinating, and a pleasant surprise, was that the serial number was 0001. This part was the first one of its kind, sold during the...
by Sean Pratt | Dec 20, 2016 | Uncategorized
“It is better to be vaguely right than exactly wrong.” Carveth Read wrote that sentence in his 1898 book Logic: Deductive and Inductive.1Although Read was not specifically referring to scientific measurements, the sentiment is the same — a high-precision...
by Sean Pratt | Sep 26, 2016 | Uncategorized
Held in Rochester, NY, the hometown of the Optical Society of America (OSA) and our team at Applied Image, Frontiers in Optics (October 17-21, 2016) is a conference that brings together industry leaders and academic professionals to share the latest trends and...
